1.

Conference Proceedings
Conference Proceedings
1. Process Dependence of Negative Bias Temperature Instability in PMOSFETS
Prasad, S. ; Li, E. ; Duong, L.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.211-216,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
2.

Conference Proceedings
Conference Proceedings
2. Impact of Wafer Backside Cu Contamination to 0.18 um Node Devices
Gu, SQ. ; Duong, L. ; Elmer, I. ; Prasad, S.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.447-454,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-6
3.

Conference Proceedings
Conference Proceedings
3. Thermoelastic Analysis of a Ceramic Composite Elevon
Ritiweger, A. ; Becker, W ; Stecher, K.-H. ; Duong, L.
Pub. info.: Proceedings, European Conference on Spacecraft Structures, Materials and Mechanical Testing, 4-6 November [1998], Braunschweig, Germany.  pp.351-358,  1999.  Noordwijk, The Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 428