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17 results

Conference Proceedings

1. UHV-TEM STUDIES OF LASER-INDUCED DAMAGE IN SILICON

Savage, T. S. ; Xu, P. ; Ai, R. ; Dunn, D. ; Marks, L. D.

Pub. info.:	Photons and low energy particles in surface processing : symposium held Decmber[i.e. December] 3-6, 1991, Boston, Massachusetts, U.S.A.. pp.495-500, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	236

Conference Proceedings

2. Investigation of Processes Related to the Growth and Repassivation of Localized Corrosion of Fe-Ni-Cr-Mo Alloys

Dunn, D. ; Sridhar, N.

Pub. info.:	Proceedings of the Symposium on Critical Factors in Localized Corrosion. pp.79-92, 1995. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	95-15

Conference Proceedings

3. The Role of Metal Salt Film Formation on Localized Corrosion Stabilization

Brossia, C.S. ; Dunn, D. ; Sridhar, N.

Pub. info.:	Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger. pp.485-499, 1998. Pennington, New Jersey. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-17

Conference Proceedings

4. Use of constraints in the superresolution of passive millimeter-wave images

Lettington, A.H. ; Dunn, D. ; Rollason, M.P. ; Alexander, N.E. ; Yallop, M.R.

Pub. info.:	Passive millimeter-wave imaging technology VI and radar sensor technology VII : 23-24 April 2003,Orlando, Florida. pp.100-109, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5077

Conference Proceedings

5. Further designs of optomechanical scanners for use in passive millimeter-wave imaging

Lettington, A.H. ; Dunn, D. ; Attia, M.F. ; Blankson, I.M.

Pub. info.:	Passive millimeter-wave imaging technology VI and radar sensor technology VII : 23-24 April 2003,Orlando, Florida. pp.22-32, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5077

Conference Proceedings

6. New Techniques for the Nanostructural Characterization of Semiconductor Materials and Devices Using Combined Focused-Ion-Beam- and Transmission-Electron-Microscopy Techniques

Hull, R. ; Dunn, D.

Pub. info.:	Electron microscopy of semiconducting materials and ULSI devices : symposium held Aprl 15-16, 1998, San Francisco, California, U. S. A.. pp.141-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	523

Conference Proceedings

7. Growth and Structure of Metallic Barrier Layer and Interconnect Films I: Experiments

Windt, D. L. ; Torre, J. Dalla ; Gilmer, G. H. ; Sapjeta, J. ; Kalyanaraman, R. ; Baumann, F. H. ; O'Sullivan, P. L. ; Dunn, D. ; Hull, R.

Pub. info.:	Advanced interconnects and contacts : symposium held April 5-7, 1999, San Francisco, California, U.S.A.. pp.307-, 1999. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	564

Conference Proceedings

8. Techniques for millimetre-wave imaging

Lettington, A. H. ; Dunn, D. ; Alexander, N. E. ; Wabby, A. ; Chen, C. -H.

Pub. info.:	Passive millimetre-wave and terahertz imaging and technology : 27-28 October 2004, London, United Kingdom. pp.16-26, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5619

Conference Proceedings

9. An all electronic passive millimeter wave imaging system

Salmon, N. A. ; Beale, J. ; Beard, A. ; Dean, M. ; Hayward, S. ; Hickling, P. ; Chiw, S. T. ; Ghafouri-Shiraz, H. ; Hall, P. ; MacPherson, R. ; Lewis, R. ; Lettington, A. H. ; Dunn, D.

Pub. info.:	Passive millimeter-wave imaging technology VIII : 30-31 March 2005, Orlando, Florida, USA. pp.11-15, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5789

10.

Conference Proceedings

10. Design and development of a high-performance passive millimeter-wave imager for aeronautical applications

Lettington, A. H. ; Dunn, D. ; Alexander, N. E. ; Wabby, A. ; Lyons, B. N. ; Doyle, R. ; Walshe, J. ; Attia, M. ; Blankson, I. M.

Pub. info.:	Radar sensor technology VIII and passive millimeter-wave imaging technology VII : 14-15 April 2004, Orlando, Florida, USA. pp.210-218, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5410

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Author: Dunn, D.