Duenas, S. ; Pelaez, R. ; Castan, E. ; Barbolla, J. ; Martil, I. ; Gonzalez-Diaz, G.
Pub. info.:
Electrically based microstructural characterization II : symposium held December 1-4, 1997, Boston, Massachusetts, U.S.A.. pp.87-, 1998. Warrendale, PA. MRS - Materials Research Society
Duenas, S. ; Castan, H. ; Barbolla, J. ; Kola, R. R. ; Sullivan, P. A.
Pub. info.:
Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A.. pp.371-, 1999. Warrendale, PA. MRS - Materials Research Society
Duenas, S. ; Castan, H. ; Barbolla, J. ; Kola, R.R. ; Sullivan, P.A.
Pub. info.:
Electrically based microstructural characterization III : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.185-190, 2002. Warrendale, PA. Materials Research Society
Duenas, S. ; Castan, H. ; Garcia, H. ; Barbolla, J. ; Kukli, K. ; Ritala, M. ; Leskela, M.
Pub. info.:
Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.. pp.147-152, 2004. Warrendale, Pa.. Materials Research Society
Castan, H. ; Duenas, S. ; Barbolla, J. ; Del Prado, A. ; San Andres, E. ; Martil, I. ; Gonzalez-Diaz, G.
Pub. info.:
Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.. pp.83-88, 2004. Warrendale, Pa.. Materials Research Society
Castan, H. ; Duenas, S. ; Barbolla, J. ; Martil, I. ; Gonzalez-Diaz, G.
Pub. info.:
Electrically based microstructural characterization III : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A.. pp.231-236, 2002. Warrendale, PA. Materials Research Society