1.

Conference Proceedings

Conference Proceedings
Cui,Z. ; Du,J.
Pub. info.: Lithography for semiconductor manufacturing II : 30 May-1 June, 2001, Edinburgh, UK.  pp.347-353,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4404
2.

Conference Proceedings

Conference Proceedings
Du,J. ; Su,J. ; Huang,Q. ; Zhang,Y. ; Guo,Y. ; Du,C. ; Cui,Z.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.348-351,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
3.

Conference Proceedings

Conference Proceedings
Du,J. ; Huang,Q. ; Guo,Y. ; Cui,Z.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.932-938,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
4.

Conference Proceedings

Conference Proceedings
Guo,Y. ; Su,J. ; Du,J. ; Huang,Q. ; Yao,J. ; Zhang,Y. ; Wei,X. ; Yuan,X. ; Yuan,J.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.161-167,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
5.

Conference Proceedings

Conference Proceedings
Ma,T. ; Xu,J. ; Wang,L. ; Huang,X. ; Du,J. ; Li,W. ; Chen,K.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.446-450,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
6.

Conference Proceedings

Conference Proceedings
Du,J. ; Gao,F. ; Zhang,Y. ; Guo,Y. ; Du,C. ; Cui,Z.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part2  pp.1047-1052,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
7.

Conference Proceedings

Conference Proceedings
Guo,Y. ; Du,J. ; Huang,Q. ; Yao,J. ; Qiu,C. ; Cui,Z.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part2  pp.686-690,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679
8.

Conference Proceedings

Conference Proceedings
Huang,Q. ; Du,J. ; Guo,Y. ; Wang,D.
Pub. info.: Algorithms, devices, and systems for optical information processing : 28-29 July 1997, San Diego, California.  pp.287-291,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3159
9.

Conference Proceedings

Conference Proceedings
Zhang,X. ; Cao,Z. ; Bai,Z. ; Li,L. ; Zhao,Z. ; Du,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.209-212,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
10.

Conference Proceedings

Conference Proceedings
Shen,G. ; Lian,P. ; Guo,X. ; Yin,T. ; Chen,C. ; Wang,G. ; Du,J. ; Cui,B. ; Li,J. ; Liu,Y. ; Gao,G. ; Zou,D. ; Chen,J. ; Ma,X. ; Chen,L.
Pub. info.: Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China.  pp.327-330,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4225