Nonintrusive inspection, structures monitoring, and smart systems for homeland security : 27-28 February 2006, San Diego, California, USA. pp.617804-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.244-255, 2003. Pennington, N.J.. Electrochemical Society
Vijayakumar, A. ; Du, T. ; Sundaram, K.B. ; Desai, V.
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Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.164-173, 2003. Pennington, N.J.. Electrochemical Society
Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.272-282, 2003. Pennington, N.J.. Electrochemical Society
Mohan, P. ; Suryanarayana, C. ; Du, T. ; Desai, V.
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Corrosion in marine and saltwater environments II : proceedings of the international symposium. pp.461-472, 2005. Pennington, NJ. Electrochemical Society
Du, T. ; Liu, M. ; Seghi, S. ; Hsia, K.J. ; Economy, J. ; Shang, J.K.
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Filled and nanocomposite polymer materials : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Medical Imaging 2004: Image Perception, Observer Performance, and Technology Assessment. pp.476-486, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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