Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58781G-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Chen, M. ; Zhu, J. ; Ma, Y. ; Du, J. ; Guo, Y. ; Du, C.
Pub. info.:
ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China. pp.60320K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Guo, X. ; Du, J. ; Chen, M. ; Ma, Y. ; Zhu, J. ; Peng, Q. ; Guo, Y. ; Du, C.
Pub. info.:
Current developments in lens design and optical engineering VI : 2-4 August 2005, San Diego, California, USA. pp.58740S-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sunar, U. ; Quon, H. ; Zhang, J. ; Du, J. ; Durduran, T. ; Zhou, C. ; Yu, G. ; Kilger, A. ; Lustig, R. ; Loevner, L. ; Nioka, S. ; Yodh, A. G. ; Chance, B.
Pub. info.:
Photon migration and diffuse-light imaging II : 12-16 June 2005, Munich, Germany. pp.58590I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment. pp.61500K-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Peng, Q. ; Guo, Y. ; Chen, B. ; Du, J. ; Xiang, J. ; Cui, Z.
Pub. info.:
Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France. pp.748-754, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Health Monitoring of Aerospace Materials and Composites II. pp.105-114, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jayaraman, S.B. ; Dick, J.P. ; Craychee, T. ; Du, J. ; Tittmann, B.R.
Pub. info.:
Smart Nondestructive Evaluation for Health Monitoring of Structural and Biological Systems. pp.397-403, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.114-123, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering