Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.42-49, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California. pp.192-198, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advanced high-power lasers : 1-5 November 1999, Osaka, Japan. pp.45-53, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.56-63, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Solid state lasers : Laser Optics '98 : 22-26 June 1998, St. Petersburg, Russia. pp.13-23, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Workshop on Laser Beam and Optics Characterization, 7-10 July, 1996, Québec City, Canada. pp.304-311, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Third International Workshop on Laser Beam and Optics Characterization, 7-10 July, 1996, Québec City, Canada. pp.381-389, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering