Dore, J.C. ; Grandjean, D. ; Benfield, R.E. ; Kroll, M. ; Bolloc'h, D. Le
Pub. info.:
Characterization of porous solids VI : proceedings of the 6th International Symposium on the Characterization of Porous Solids (COPS-VI), Alicante, Spain, May 8-11, 2002. pp.163-170, 2002. Amsterdam. Elsevier
Szczygielska, A. ; Burian, A. ; Duber, S. ; Dore, J.C. ; Honkimaki, V.
Pub. info.:
Characterization of porous solids VI : proceedings of the 6th International Symposium on the Characterization of Porous Solids (COPS-VI), Alicante, Spain, May 8-11, 2002. pp.561-568, 2002. Amsterdam. Elsevier
Kroll, M. ; Benfield, R.E. ; Dore, J.C. ; Grandjean, D. ; Schmid, G.
Pub. info.:
Application of synchrotron radiation techniques to materials science VI : symposium held April 16-20, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, Penn.. Materials Research Society
Szczygielska, A. ; Burian, A. ; Dore, J.C. ; Duber, S. ; Hannon, A.
Pub. info.:
Solid State Crystals 2002: Crystalline Materials for Optoelectronics. pp.288-294, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering