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Conference Proceedings

1. Polarization properties of the luminescence from silicon nanocrystals

Diener,J. ; Kovalev,D.I. ; Polisski,G. ; Koch,F.

Pub. info.:	Fifth international conference on material science and material properties for infrared optoelectronics : 22-24 may 2000, Kiev, Ukraine. pp.137-141, 2000. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4355

Conference Proceedings

2. Poole-Frenkel Ionization of Ge:Hg in Terahertz Electromagnetic Fields

Ganichev,S.D. ; Mayerhofer,B. ; Yassievich,I.N. ; Diener,J. ; Prettl,W.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1543-1546, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201

Conference Proceedings

3. Direct Experimental Evidence of Autolocalization Nature of DX-Centers

Ganichev,S.D. ; Yassievich,I.N. ; Prettl,W. ; Diener,J. ; Meyer,B.K. ; Benz,K.W.

Pub. info.:	Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.1079-1084, 1995. Zurich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	196-201