1.

Conference Proceedings
Conference Proceedings
1. Behaviour of Boron After Implantation into Silicon-Schottky Diodes:A β-NMR Study on the Fermi-Level Dependence
Frank,H.-P. ; Diehl,E. ; Ergezinger,K.-H. ; Fischer,B. ; Ittermann,B. ; Mai,F. ; Marbach,K. ; Weißenmayer,S. ; Welker,G. ; Ackermann,H. ; Stockman,H.-J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.135-140,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. Ring imaging detector for cosmic-ray observations
Ellithorpe,D. ; Diehl,E. ; Muller,D. ; Swordy,S.P.
Pub. info.: Gamma-ray and cosmic-ray detectors, techniques, and missions : 5-7 August 1996, Denver, Colorado.  pp.84-89,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2806
3.

Conference Proceedings
Conference Proceedings
3. Large-area transition radiation detectors for cosmic-ray observations in space
Muller,D. ; Diehl,E. ; Gahbauer,F. ; Meyer,P. ; Swordy,S.P.
Pub. info.: Gamma-ray and cosmic-ray detectors, techniques, and missions : 5-7 August 1996, Denver, Colorado.  pp.76-83,  1996.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2806
4.

Conference Proceedings
Conference Proceedings
4. βNMR of nonsubstitutional 12B after implantation into p-type silicon
Fischer,B. ; Seelinger,W. ; Diehl,E. ; Ergezinger,K.-H. ; Frank,H.-P. ; Ittermann,B. ; Mai,F. ; Welker,G. ; Ackermann,H. ; Stockmann,H.-J.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.269-272,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87