Charriere, F. ; Marquet, P. ; Von Ehr, M. ; Cuche, E. ; Depeursinge, C.
Pub. info.:
Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany. pp.58640D-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Froehly, L. ; Bachmann, A. ; Lasser, T. ; Depeursinge, C. ; Lang, F.
Pub. info.:
Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany. pp.586406-586406, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bellouard, Y. ; Colomb, T. ; Depeursinge, C. ; Said, A. A. ; Dugan, M. ; Bado, P.
Pub. info.:
Commercial and biomedical applications of ultrafast lasers VI : 22-25 January 2006, San Jose, California, USA. pp.61080M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical Measurement Systems for Industrial Inspection IV. pp.1022-1027, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Charriere, F. ; Cuche, E. ; Marquet P ; Depeursinge, C.
Pub. info.:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII. pp.609008-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Colomb, T. ; Kuhn, J. ; Cuche, E. ; Montfort, F. ; Marian, A. ; Aspert, N. ; Marquet, P. ; Depeursinge, C.
Pub. info.:
Optical Micro- and Nanometrology in Microsystems Technology. pp.618805-618805, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Kuhn, J. ; Cuche, E. ; Emery, Y. ; Colomb, T. ; Charriere, F. ; Montfort, F. ; Botkine, M. ; Aspert, N. ; Depeursinge, C.
Pub. info.:
Optical Micro- and Nanometrology in Microsystems Technology. pp.618804-618804, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
montfort, F. ; Charriere, F. ; Colomb, T. ; Kuehn, J. ; Cuche, E. ; Depeursinge, C.
Pub. info.:
Optical Micro- and Nanometrology in Microsystems Technology. pp.618802-618802, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering