1.

Conference Proceedings

Conference Proceedings
Charriere, F. ; Marquet, P. ; Von Ehr, M. ; Cuche, E. ; Depeursinge, C.
Pub. info.: Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany.  pp.58640D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5864
2.

Conference Proceedings

Conference Proceedings
Froehly, L. ; Bachmann, A. ; Lasser, T. ; Depeursinge, C. ; Lang, F.
Pub. info.: Novel optical instrumentation for biomedical applications II : 12-16 June 2005, Munich, Germany.  pp.586406-586406,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5864
3.

Conference Proceedings

Conference Proceedings
Bellouard, Y. ; Colomb, T. ; Depeursinge, C. ; Said, A. A. ; Dugan, M. ; Bado, P.
Pub. info.: Commercial and biomedical applications of ultrafast lasers VI : 22-25 January 2006, San Jose, California, USA.  pp.61080M-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6108
4.

Conference Proceedings

Conference Proceedings
Colomb, T. ; Cuche, E. ; Depeursinge, C.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.1022-1027,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856
5.

Conference Proceedings

Conference Proceedings
Charriere, F. ; Cuche, E. ; Marquet P ; Depeursinge, C.
Pub. info.: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIII.  pp.609008-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6090
6.

Conference Proceedings

Conference Proceedings
Colomb, T. ; Kuhn, J. ; Cuche, E. ; Montfort, F. ; Marian, A. ; Aspert, N. ; Marquet, P. ; Depeursinge, C.
Pub. info.: Optical Micro- and Nanometrology in Microsystems Technology.  pp.618805-618805,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6188
7.

Conference Proceedings

Conference Proceedings
Kuhn, J. ; Cuche, E. ; Emery, Y. ; Colomb, T. ; Charriere, F. ; Montfort, F. ; Botkine, M. ; Aspert, N. ; Depeursinge, C.
Pub. info.: Optical Micro- and Nanometrology in Microsystems Technology.  pp.618804-618804,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6188
8.

Conference Proceedings

Conference Proceedings
montfort, F. ; Charriere, F. ; Colomb, T. ; Kuehn, J. ; Cuche, E. ; Depeursinge, C.
Pub. info.: Optical Micro- and Nanometrology in Microsystems Technology.  pp.618802-618802,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6188
9.

Conference Proceedings

Conference Proceedings
Emery, Y. ; Cuche, E. ; Marquet, F. ; Aspert, N. ; Marquet, P. ; Kuhn, J. ; Botkine, M. ; Colomb, T. ; Montfort, F. ; Charriere, F. ; Depeursinge, C.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.930-937,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856