Deng, J. ; Pearce, J. M. ; Vlahos, V. ; Koval, R. J. ; Collins, R. W. ; Wronski, C. R.
Pub. info.:
Amorphous and nanocrystalline silicon-based films - 2003 : symposium held April 22-25, 2003, San Francisco, California, U.S.A.. pp.303-308, 2003. Warrendale. Materials Research Society
Vlahos, V. ; Deng, J. ; Pearce, J. M. ; Koval, R. J. ; Ferreira, G. M. ; Collins, R. W. ; Wronski, C. R.
Pub. info.:
Amorphous and nanocrystalline silicon-based films - 2003 : symposium held April 22-25, 2003, San Francisco, California, U.S.A.. pp.351-356, 2003. Warrendale. Materials Research Society
Optical design and testing II : 8-12 November 2004, Beijing, China. pp.967-975, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optics in Health Care and Biomedical Optics: Diagnostics and Treatment II. pp.308-315, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Deng, J. ; Pearce, J.M. ; Vlahos, V. ; Collins, R.W. ; Wronski, C.R.
Pub. info.:
Amorphous and nanocrystalline silicon science and technology - 2004 : symposium held April 13-16, 2004, San Francisco, California, U.S.A.. pp.623-628, 2004. Warrendale. Materials Research Society
Amorphous and nanocrystalline silicon science and technology - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.451-456, 2005. Warrendale, Pa.. Materials Research Society
Amorphous and nanocrystalline silicon science and technology - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.. pp.457-462, 2005. Warrendale, Pa.. Materials Research Society
Qi, B. ; Pickrell, G.R. ; Zhang, P. ; Duan, Y. ; Peng, W. ; Xu, J. ; Huang, Z. ; Deng, J. ; Xiao, J. ; Wang, Z. ; Huo, W. ; May, R.G. ; Wang, A.
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Fiber optic sensor technology and applications 2001 : 30 October-1 November 2001, Newton, [Massachusetts] USA. pp.182-190, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Rumyantsev, S. L. ; Sawyer, S. ; Pala, N. ; Shur, M. S. ; Bilenko, Yu. ; Zhang, J. P. ; Hu, X. ; Lunev, A. ; Deng, J. ; Gaska, R.
Pub. info.:
Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA. pp.75-85, 2005. Bellingham, Washington. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering