1.

Conference Proceedings
Conference Proceedings
1. Origin of improved luminescence efficiency after annealing of Ga(In)Nas materials grown by molecular beam epitaxy
Li, W. ; Pessa, M. ; Ahlgren, T. ; Dekker, J.
Pub. info.: Photodetector materials and devices VII : 21-23 January 2002, San Jose, USA.  pp.207-212,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4650
2.

Conference Proceedings
Conference Proceedings
2. SOI Wafers with Buried Cavities
Suni, T. ; Henttinen, K. ; Dekker, J. ; Luoto, H. ; Kulawski, M. ; Makinen, J. ; Mutikainen, R.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.216-225,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
3.

Conference Proceedings
Conference Proceedings
3. Wafer Scale Packaging of MEMS by Using Plasma Activated Wafer Bonding
Suni, T. ; Henttinen, K. ; Lipsainen, A. ; Dekker, J. ; Luoto, H. ; Kulawski, M.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.173-183,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
4.

Conference Proceedings
Conference Proceedings
4. Origin of Improved Luminescence Efficiency After Annealing of Ga(In)Nas Materials Grown by Molecular Beam Epitaxy (Invited)
Li, W. ; Pessa, M. ; Ahlgren, T. ; Dekker, J.
Pub. info.: State-of-the-art program on compound semiconductors XXXVII (SOTAPOCS XXXVII) and narrow bandgap optoelectronic materials and devices : proceedings of the international symposia.  pp.18-28,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-14
5.

Conference Proceedings
Conference Proceedings
5. A van der Waals Force Model of Bonded Substrates
Farrens, S. ; Dekker, J.
Pub. info.: Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications.  pp.184-190,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-7
6.

Conference Proceedings
Conference Proceedings
6. Positron Annihilation Studies of Defects at the SiO2/SiC Interface
Dekker, J. ; Saarinen, K. ; Olafsson, H.O. ; Sveinbjornsson, E.O.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.543-546,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436