1.

Conference Proceedings
Conference Proceedings
1. THE ROLE OF ELECTRON AND HOLE TRAPS IN THE DEGRADATION AND BREAKDOWN OF THERMALLY GROWN SiO2 LAYERS
Heyns, M. M. ; De Keersmaecker, R. F.
Pub. info.: SiO[2] and its interfaces : symposium held November 30-December 5, 1987, Boston, Massachusetts, U.S.A..  pp.205-218,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 105
2.

Conference Proceedings
Conference Proceedings
2. CHARACTERIZATION OF DOPE Si-TiSi2 BILAYERS FORMED BY ION BEAM MXING AND RAPID THERMAL ANNEALING
Maex, K. ; De Keersmaecker, R. F. ; Alkemade, P. F. A.
Pub. info.: Ion beam processes in advanced electronic materials and device technology : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.153-158,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 45
3.

Conference Proceedings
Conference Proceedings
3. AMORPHOUS PHASE FORMATION DURING ION MIXING OF Ti/Si BILAYERS AT ELEVATED TEMPERATURE
Maex, K. ; De Keersmaecker, R. F. ; Van Rossum, M. ; van der Weg, W. F.
Pub. info.: Fundamentals of beam-solid interactions and transient thermal processing : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.63-68,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 100