1.

Conference Proceedings
Conference Proceedings
1. Accurate Infrared Absorption Measurement of Interstitial and Precipitated Oxygen in Heavily Doped Silicon
De Gryse, O. ; Clauws, P. ; Rossou, L. ; Van Landuyt, J. ; Vanhellemont, J. ; Mondelaers, W.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.398-409,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
2.

Conference Proceedings
Conference Proceedings
2. On the Nucleation and Growth of Bulk Stacking Faults in Cz Silicon
Vanhellemont, J. ; De Gryse, O. ; Clauws, P.
Pub. info.: High purity silicon VII : proceedings of the international symposium.  pp.91-104,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-20