1.

Conference Proceedings
Conference Proceedings
1. Surface Polariton Raman Spectroscopy in Cubic GaN Epitaxial Layers
Davydov,V.Yu. ; Subashiev,A.V. ; Cheng,T.S. ; Foxon,C.T. ; Goncharuk,I.N. ; Smirnov,A.N. ; Zolotareva,R.V. ; Lundin,W.V.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1371-1374,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
2.

Conference Proceedings
Conference Proceedings
2. Impact of radiation-induced defects on the yellow luminescence in MOCVD GaN
Emtsev,V.V. ; Davydov,V.Yu. ; Goncharuk,I.N. ; Kalinina,E.V. ; Kozlovskii,V.V. ; Poloskin,D.S. ; Sakharov,A.V. ; Shmidt,N.M. ; Smimov,A.N. ; Usikov,A.S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1143-1148,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings
Conference Proceedings
3. Electrical and Optical Properties of Highly Strained GaN Epilayers
Usikov,A.S. ; Lundin,W.V. ; Pushnyi,B.V. ; Shmidt,N.M. ; Davydov,V.Yu. ; Sakharov,A.V. ; Shubina,T.V. ; Toropov,A.A. ; Faleev,N.N. ; Shcheglov,M. ; Tsatsul'nikov,A.F.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1393-1396,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
4.

Conference Proceedings
Conference Proceedings
4. Electronic and structural properties of InN thin films grown by MOMBE on sapphire substrates
Aderhold,J. ; Davydov,V.Yu. ; Fedler,F. ; Klausing,H. ; Mistele,D. ; Rotter,T. ; Semchinova,O. ; Stemmer,J. ; Graul,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.82-86,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086