Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA. pp.58690V-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced characterization techniques for optics, semiconductors, and nanotechnologies II : 2-4 August, 2005, San Diego, California, USA. pp.58780B-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Karodkar, D. ; Gardner, N. ; Bergner, B.C. ; Davies, A.
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Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.261-273, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.244-252, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical manufacturing and testing V : 3-5 August 2003, San Diego, California, USA. pp.236-243, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Mandl, D. ; Frye, S. ; Grosvenor, S. ; Ingram, M. A. ; Langley, J. ; Miranda, F. A. ; Lee, R. Q. ; Romanofsky, R. R. ; Zaman, A. ; Popovic, Z. ; Sherwood, R. L. ; Chien, S. ; Davies, A.
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Enabling sensor and platform technologies for spaceborne remote sensing : 9-10 November 2004, Honolulu, Hawaii, USA. pp.301-311, 2005. Asia-Pacific Environmental Remote Sensing. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Airborne intelligence, surveillance, reconnaissance (ISR) systems and applications II : 29-30 March 2005, Orlando, Florida, USA. pp.9-16, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sherwood, R. L. ; Chien, S. ; Davies, A. ; Mandl, D. ; Frye, S.
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Image processing and pattern recognition in remote sensing II :8-9 November 2004, Honolulu, Hawaii, USA. pp.47-55, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Medicus, K. M. ; Karodkar, D. ; Bergner, B. C. ; Gardner, N. ; Davies, A.
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Lithographic and micromachining techniques for optical component fabrication II : 3-4 August 2003, San Diego, California, USA. pp.85-93, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the 5th ESA International Conference on Spacecraft Guidance, Navigation, and Control Systems, Frascati, Italy, 22-25 October 2002. pp.87-90, 2003. Noordwijk, Netherlands. ESA Publications Division