1.

Conference Proceedings
Conference Proceedings
1. Stress Metrology : The Challenge for the Next Generation of Engineered Wafers
Tiberi, Antoine ; Paillard, Vincent ; Aulnette, Cecile ; Daval, Nicolas ; Bourdelle, Konstantin K. ; Moreau, Myriam ; Kennard, Mark ; Cayrefourcq, Ian
Pub. info.: High-mobility group-IV materials and devices : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.97-102,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 809
2.

Conference Proceedings
Conference Proceedings
2. A New Process for the Fabrication of SiC Power Devices and Systems on SiCOI (Silicon Carbide On Insulator) Substrates
Templier, Francois ; Daval, Nicolas ; Cioccio, Lea Di ; Bourgeat, Daniel ; Letertre, Fabrice ; Planson, Dominique ; Chante, Jean-Pierre ; Billon, Thierry
Pub. info.: Silicon carbide 2002 -- materials, processing and devices : symposium held December 2-4, 2002, Boston, Massachusetts, U.S.A..  pp.393-398,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 742