1.

Conference Proceedings

Conference Proceedings
Apostol, D. ; Garoi, F. ; Timcu, A. ; Damian, V. ; Logofatu, P.C. ; Nascov, V.
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies II : 24-26 November, 2004, Bucharest, Romania.  pp.59720K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5972
2.

Conference Proceedings

Conference Proceedings
M-ller, R. ; Obreja, P. ; Kusko, M. ; Esinenco, D. ; Tibeica, C. ; Conache, G. ; Apostol, D. ; Damian, V. ; Mateescu, M. ; Diaconu, M. ; Moldovan, L.
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies II : 24-26 November, 2004, Bucharest, Romania.  pp.59720Z-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5972
3.

Conference Proceedings

Conference Proceedings
Nascov, V. ; Timcu, A. ; Apostol, D. ; Garoi, F. ; Damian, V. ; Iordache, I. ; Logofatu, P.C.
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies II : 24-26 November, 2004, Bucharest, Romania.  pp.59721C-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5972
4.

Conference Proceedings

Conference Proceedings
Nascov, V. ; Apostol, D. ; Garoi, F. ; Damian, V. ; Iordache, I. ; Logofatu, P. C.
Pub. info.: Holography 2005: International Conference on Holography, Optical Recording, and Processing of Information.  pp.62521P-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6252
5.

Conference Proceedings

Conference Proceedings
Nascov, V. ; Dobroiu, A. ; Apostol, D. ; Damian, V.
Pub. info.: Optical Measurement Systems for Industrial Inspection III.  pp.96-104,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5144