Laser diodes and leds in industrial, measurement, imaging, and sensors applications II : testing, packaging, and reliability of semiconductor lasers V : 26-25 January 2000, San Jose, California. pp.32-41, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Optical scanning systems: design and applications : 30-31 July, 1997, San Diego, California. pp.300-307, 1997. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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