Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
C. Teutsch ; D. Berndt ; N. Schmidt ; E. Trostmann
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Two- and three-dimensional methods for inspection and metrology IV : 1-3 October, 2006, Boston, Massachusetts, USA. 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
D. Berndt ; M. Luckow ; J. T. Lambrecht ; F. Beckmann ; B. Müller
Pub. info.:
Developments in X-ray tomography VI : 12-14 August 2008, San Diego, California, USA. pp.70780N-1-70780N-10, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
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