1.

Conference Proceedings
Conference Proceedings
1. THE EFFECT OF SILICIDE FORMATION ON THE ELECTRICAL PROPERTIES OF GATE OXIDES
Gambino, J. P. ; Cunningham, B. ; Buchanan, D. A.
Pub. info.: Advanced metallization and processing for semiconductor devices and circuits--II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A..  pp.181-186,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 260
2.

Conference Proceedings
Conference Proceedings
2. DC Magnetron Reactive Sputtering of Low Stress AIN Piezoelectric Thin Films for MEMS Application
Cunningham, B. ; Hsieh, P. ; Reif, R.
Pub. info.: Materials science of microelectromechanical systems (MEMS) devices : symposium held December 1-2, 1998, Boston, Massachusetts, U.S.A..  pp.165-170,  1999.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 546
3.

Conference Proceedings
Conference Proceedings
3. LOW TEMPERATURE OXIDATION OF PtSi ON As-DOPED Si
Gambino, J. P. ; Cunningham, B. ; Turene, F. E. ; Shepard, J. F.
Pub. info.: Polysilicon films and interfaces : symposium held December 1-3, 1987, Boston, Massachusetts, U.S.A..  pp.181-186,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 106
4.

Conference Proceedings
Conference Proceedings
4. PtSi CONTACT METALLURGY BY DIFFERENT FORMATION PROCESSES
Chang, Chin-An ; Huang, H.-C. W. ; Segmuller, A. ; Turene, F.E. ; Cunningham, B. ; Sugerman, A. ; Totta, P.A.
Pub. info.: Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA.  pp.775-780,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 54
5.

Conference Proceedings
Conference Proceedings
5. TEM/EBIC Investigations of Structural Defects in Polycrystalline Solar Cells
Ast, D. G. ; Cunningham, B. ; Gleichmann, R.
Pub. info.: Electron microscopy of materials : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.85-96,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 31
6.

Conference Proceedings
Conference Proceedings
6. The electrical activity at twin boundaries in silicon
Cunningham, B. ; Strunk, H.P. ; Ast, D.G.
Pub. info.: Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.51-56,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 5
7.

Conference Proceedings
Conference Proceedings
7. High resolution electron microscopy of grain boundaries in silicon
Cunningham, B. ; Ast, D.
Pub. info.: Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.21-26,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 5
8.

Conference Proceedings
Conference Proceedings
8. Characterization of Electrically Pulsed Chromium Disilicide Fusible Links
Domenicucci, A. G. ; Cunningham, B. ; Tsang, P.
Pub. info.: Electron microscopy of semiconducting materials and ULSI devices : symposium held Aprl 15-16, 1998, San Francisco, California, U. S. A..  pp.103-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 523