1.

Conference Proceedings
Conference Proceedings
1. OPTICAL STUDIES OF POROUS SILICON
Lin, T. ; Sixta, M.E. ; Cox, J.N. ; Delaney, M.E.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.379-384,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
2.

Conference Proceedings
Conference Proceedings
2. Thin Film Measurements by Spectroscopic Ellipsometry Over an Extended Range
Cox, J.N. ; Hutchinson, J.M. ; Lee, K.K.D. ; Sheridan, B. ; Wong, R. ; Yang, I.-C.J.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.636-643,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
3.

Conference Proceedings
Conference Proceedings
3. Silanol In CVD Thin Films
Cox, J.N.
Pub. info.: Proceedings of the third Symposium on Silicon Nitride and Silicon Dioxide Thin Insulating Films.  pp.117-126,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-16
4.

Conference Proceedings
Conference Proceedings
4. CHARACTERIZATION OF THIN FILM DIELECTRICS BY FTIRS
Cox, J.N.
Pub. info.: Materials characterization : symposium held April 15-17, 1986, Palo Alto California, U.S.A..  pp.219-224,  1986.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 69
5.

Conference Proceedings
Conference Proceedings
5. The Spatial Resolution of Water Diffusion and Trapping in Silicate-Glass Thin Films by Micro-ETIR and Neutron Depth Profiling
Cox, J.N. ; Hwang, K. ; Kwok, K. ; Downing, R.G. ; Lamaze, G.
Pub. info.: Proceedings of the Twelfth International Symposium on Chemical Vapor Deposition.  pp.336-342,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-2
6.

Conference Proceedings
Conference Proceedings
6. Multivariate Classification of BPSG Thin Films Using Mahalanobis Distances
Zhang, S. ; Franke, J.E. ; Niemezyk, T.M. ; Haaland, D.M. ; Cox, J.N. ; Banerjee, I. ; Gee, J. ; Dang, T. ; Puich, M.
Pub. info.: Proceedings of the Symposium on Process control, Diagnostics, and Modeling in Semiconductor Manufacturing.  pp.438-445,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-2