1.

Conference Proceedings

Conference Proceedings
Goy,J. ; Courtois,B. ; Karam,J.M.
Pub. info.: Sensors and camera systems for scientific, industrial, and digital photography applications II : 22-24 January 2001, San Jose, [California] USA.  4306  pp.93-99,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4306
2.

Conference Proceedings

Conference Proceedings
Karam,J.-M. ; Courtois,B. ; Rencz,M. ; Poppe,A. ; Szekely,V.
Pub. info.: Microlithography and Metrology in Micromachining II.  pp.236-245,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2880
3.

Conference Proceedings

Conference Proceedings
Juneidi,Z. ; Torki,K. ; Charlot,B. ; Courtois,B.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  4408  pp.159-164,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4408
4.

Conference Proceedings

Conference Proceedings
Ribas,R.P. ; Lescot,J. ; Leclercq,J.-L. ; Courtois,B.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  4408  pp.438-444,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4408
5.

Conference Proceedings

Conference Proceedings
Charlot,B. ; Parrain,F. ; Mir,S. ; Courtois,B.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  4408  pp.96-103,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4408
6.

Conference Proceedings

Conference Proceedings
Karam,J. ; Courtois,B. ; Holjo,M. ; Leclercq,J.L. ; Viktorovitch,P.
Pub. info.: Micromachining and microfabrication process technology II : 14-15 October, 1996, Austin, Texas.  pp.315-326,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2879
7.

Conference Proceedings

Conference Proceedings
Poppe,A. ; Rencz,M. ; Szekely,V. ; Karam,J.-M. ; Courtois,B. ; Hofmann,K. ; Glesner,M.
Pub. info.: Micromachined Devices and Components.  pp.215-224,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2642
8.

Conference Proceedings

Conference Proceedings
Charlot,B. ; Moussouris,S. ; Mir,S. ; Courtois,B.
Pub. info.: Design, test, and microfabrication of MEMS and MOEMS : 30 March-1 April 1999, Paris, France.  Part1  pp.398-405,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3680
9.

Conference Proceedings

Conference Proceedings
Boutamine,H. ; Karam,J.M. ; Courtois,B. ; Drake,P. ; Oudinot,J. ; El Tahawi,H. ; Cao,A. ; Rencz,M. ; Poppe,A. ; Szekely,V.
Pub. info.: Microlithography and Metrology in Micromachining III.  pp.76-84,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3225
10.

Conference Proceedings

Conference Proceedings
Szekely,Vladimir ; Rencz,M. ; Courtois,B.
Pub. info.: 1996 International Symposium on Microelectronics : 8-10 October 1996, Minneapolis Convention Center, Minneapolis, Minnesota.  pp.18-23,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2920