1.

Conference Proceedings

Conference Proceedings
Davy,S. ; Spajer,M. ; Courjon,D.A. ; Coluzza,C. ; Generossi,R. ; Cricenti,A. ; Barchesi,C. ; Almeida,J. ; Faini,G.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.520-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
2.

Conference Proceedings

Conference Proceedings
Charraut,D. ; Courjon,D.A. ; Bainier,C. ; Moulinier,L.
Pub. info.: Vision Systems: New Image Processing Techniques.  pp.95-104,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2785
3.

Conference Proceedings

Conference Proceedings
Coluzza,C. ; Almeida,J. ; Dell'Orto,T. ; Bergossi,O. ; Spajer,M. ; Davy,S. ; Courjon,D.A. ; Cricenti,A. ; Generosi,R. ; Perfetti,P. ; Faini,G.
Pub. info.: Optical Inspection and Micromeasurements.  pp.591-601,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2782
4.

Conference Proceedings

Conference Proceedings
Bainier,C. ; Courjon,D.A. ; Salvi,J. ; Baida,F. ; Girard,C. ; Vigoureux,J.-M. ; Castiaux,A.
Pub. info.: Optical Inspection and Micromeasurements.  pp.582-590,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2782