Air monitoring and detection of chemical and biological agents : 2-3 November 1998, Boston, Massachusetts. pp.164-173, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared technology and applications XXV : 5-9 April 1999, Orlando, Florida. pp.24-35, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Application of tunable diode and other infrared sources for atmospheric studies and industrial process monitoring : 8-9 August 1996, Denver, Colorado. pp.2-16, 1996. Bellingham, WA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays V : 14-17 April 1998, Orlando, Florida. pp.562-571, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical remote sensing for environmental and process monitoring : proceedings of a symposium sponsored by the Air & Waste Management Association, San Francisco, CA, September 25-27, 1995. pp.17-25, 1996. Pittsburgh, Penn.. Air & Waste Management Association
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical and IR telescope instrumentation and detectors : 27-31 March 2000, Munich, Germany. Part2 pp.1240-1253, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared spaceborne remote sensing IV : 6-7 August 1996, Denver, Colorado. pp.150-159, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Vujkovic-Cvijin,P. ; Cooper,D.E. ; Laan,J.E.van der ; Warren,R.E.
Pub. info.:
Application of tunable diode and other infrared sources for atmospheric studies and industrial processing monitoring II : 19-20 July 1999, Denver, Colorado. pp.142-151, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared Detectors and Focal Plane Arrays VI : 25-27 April 2000, Orlando, USA. pp.331-342, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared astronomical instrumentation : 23-25 March 1998, Kona, Hawaii. Part 1 pp.66-76, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering