1.

Conference Proceedings
Conference Proceedings
1. Contact Processes For Advanced DRAM And CMOS Logic Devices*
Gambino, J. ; Bandy, K. ; Chapple-Sokol, J. ; Conti, R. ; Dobuzinsky, D. ; Iggulden, R. ; Maldei, M. ; Peterson, K. ; Rupp, T. ; Stamper, T. ; Stephens, J. ; Sardesai, V. ; Wise, M. ; Wagner, T. ; Weber, S. ; Wistrom, R.
Pub. info.: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology.  pp.473-484,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-17
2.

Conference Proceedings
Conference Proceedings
2. Surface Roughness Evaluation of CVD Doped Oxide Films for Advanced Deep Sub-Micron Semiconductor Applications
Ilg, M. ; Ploessl, R. ; Stuber, J. ; Conti, R. ; Cote, D. ; Gambino, J. ; Tobben, D. ; Kirchoff, M.
Pub. info.: Chemical vapor deposition : proceedings of the Fourteenth International Conference and EUROCVD-11.  pp.749-755,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-25
3.

Conference Proceedings
Conference Proceedings
3. A tracking approach to localization and synchronization in mobile ad-hoc sensor networks [6249-20]
Bidigare, P. ; Kreucher, C. ; Conti, R.
Pub. info.: Defense transformation and network-centric systems : 17-20 April 2006, Kissimmee, Florida, USA.  pp.62490I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6249
4.

Conference Proceedings
Conference Proceedings
4. Low Temperature Borophosphosilicate Glass (BPSG) Process for High Aspect Ratio Gap Fill
Belyansky, M. ; Conti, R. ; Upham, A. ; Liucci, F. ; Parks, C. ; Lee, K.-H. ; Strane, J.
Pub. info.: Rapid thermal and other short-time processing technologies III : proceedings of the international symposium.  pp.47-52,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-11
5.

Conference Proceedings
Conference Proceedings
5. Hardmask technology for sub-100 nm lithographic imaging
Babich, K. ; Mahorowala, A.P. ; Medeiros, D.R. ; Pfeiffer, D. ; Petrillo, K.E. ; Angelopoulos, M. ; Grill, A. ; Patel, V. ; Halle, S. ; Brunner, T.A. ; Conti, R. ; Allen, S.D. ; Wise, R.
Pub. info.: Advances in Resist Technology and Processing XX.  1  pp.152-165,  2003.  Bellingham, CA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5039