1.

Conference Proceedings
Conference Proceedings
1. Near-field imaging of the photocurrent on Au/GaAs interface with various wavelengths
Davy,S. ; Spajer,M. ; Courjon,D.A. ; Coluzza,C. ; Generossi,R. ; Cricenti,A. ; Barchesi,C. ; Almeida,J. ; Faini,G.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.520-525,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
2.

Conference Proceedings
Conference Proceedings
2. Shallow and deep radiative levels of H-complexes in GaAs
Capizzi,M. ; Coluzza,C. ; Enailiani,V. ; Frankl,P. ; Frova,A. ; Sarto,F.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.599-604,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
3.

Conference Proceedings
Conference Proceedings
3. Spatially resolved study of Schottky barriers
Coluzza,C. ; Almeida,J. ; Dell'Orto,T. ; Bergossi,O. ; Spajer,M. ; Davy,S. ; Courjon,D.A. ; Cricenti,A. ; Generosi,R. ; Perfetti,P. ; Faini,G.
Pub. info.: Optical Inspection and Micromeasurements.  pp.591-601,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2782