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Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.306-316, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics. pp.145-156, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering