1.

Technical Paper
Technical Paper
1. The Prediction of Volumetric Efficiency Considering Gas Exchange Process in Spark Ignition Engine
Soh,S.G. ; Chung,J.E. ; Kim,E.S.
Pub. info.: Proceedings of the Fourth International Pacific Conference on Automotive Engineering : Melbourne, Australia, November 8-14, 1987 : mobility, the technical challenge.  pp.170-,  1987.  Warrendale, Pa..  Society of Automotive Engineers
Title of ser.: SAE publication
Ser. no.: P-212
2.

Conference Proceedings
Conference Proceedings
2. Key issues in evaluating hot-carrier reliability
Chung,J.E.
Pub. info.: Microelectronic Device and Multilevel Interconnection Technology II.  pp.64-74,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2875
3.

Conference Proceedings
Conference Proceedings
3. Statistical metrology:understanding spatial variation in semiconductor manufacturing
Boning,D.S. ; Chung,J.E.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II.  pp.16-26,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2874
4.

Conference Proceedings
Conference Proceedings
4. Inter-and intra-die polysilicon critical dimension variation
Stine,B.E. ; Boning,D.S. ; Chung,J.E. ; Bell,D.A. ; Equi,E.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II.  pp.27-35,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2874
5.

Conference Proceedings
Conference Proceedings
5. Evaluation of pad life in chemical mechanical polishing process using statistical metrology
Muthukrishnan,N.M. ; Prasad,S. ; Stine,B.E. ; Loh,W. ; Nagahara,R. ; Chung,J.E. ; Boning,D.S.
Pub. info.: Microelectronic Manufacturing Yield, Reliability, and Failure Analysis III.  pp.70-79,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3216