1.

Conference Proceedings
Conference Proceedings
1. Characterization and modeling of low-frequency noise in sub-0.1 -pm SiGe pMOSFETs
Romanjek, K. ; Chroboczek, J. A. ; Ghibaudo, G. ; Ernst, T.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.496-506,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
2.

Conference Proceedings
Conference Proceedings
2. Direct extraction of McWhorter's constant from LFN spectra of MOSFETs with planar layers of Si nanocrystals embedded in gate SiO2
Ferraton, S. ; Zimmermann, J. ; Montres, L. ; Ghibaudo, G. ; Brini, J. ; Gurgul, J. ; Chroboczek, J. A.
Pub. info.: Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain.  pp.560-565,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5470
3.

Conference Proceedings
Conference Proceedings
3. STRESS IN THIN LAYERS APPLIED BY SUBSTRATE BENDING; CALIBRATION AND POTENTIALITIES
Chroboczek, J. A. ; Stohr, M. ; Whall, T. E.
Pub. info.: Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.91-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 308
4.

Conference Proceedings
Conference Proceedings
4. Low Frequency Noise Studies of Si Nano-Crystal Effects in MOS Transistors and Capacitors
Ferraton, S. ; Montes, L. ; Ionica, I. ; Zimmermann, J. ; Chroboczek, J. A.
Pub. info.: Advanced experimental methods for noise research in nanoscale electronic devices.  pp.137-144,  2004.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 151
5.

Conference Proceedings
Conference Proceedings
5. Effect of Heavy Doping on the Photoluminescence and Photoreflectance Spectra of Silicon and SiGe Layers
Bru-Chevallier, C. ; Trui, B. ; Souifi, A. ; Bremond, G. ; Guillot, G. ; Chroboczek, J. A.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.295-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406
6.

Conference Proceedings
Conference Proceedings
6. Oxygen-enhanced 1.54ｦﾌm photoluminescence of Er+3 in silicon
d'Avitaya Arnaud, F. ; Campidelli, Y. ; Chroboczek, J. A. ; Favennec, P. N. ; L'Haridon, H. ; Moutonnet, D. ; Wasiela, A.
Pub. info.: Rare earth doped semiconductors : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.97-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 301