1.

Conference Proceedings
Conference Proceedings
1. PAC STUDIES OF DEFECTS IN AgCl AND II-VI COMPOUNDS
Austin, J.C. ; Swanson, M.L. ; Hughes, W.C. ; Choi, S.S.
Pub. info.: Defects in materials : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A..  pp.469-474,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 209
2.

Conference Proceedings
Conference Proceedings
2. Field Emission Study of Ti-Silicide Array
Jung, M.Y. ; Kim, D. W ; Choi, S.S. ; Kim, S.B. ; Jeon, H. T
Pub. info.: Cold cathodes II : proceedings of the international symposium.  pp.167-174,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-18
3.

Conference Proceedings
Conference Proceedings
3. Field Induced Thickening of Au-coated Nanosize Si-tip and Field Emission from PR-coated Si-tip
Choi, S.S. ; Jung, M.Y ; Kim, D.W ; Joo, M.S.
Pub. info.: Cold cathodes II : proceedings of the international symposium.  pp.159-166,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-18
4.

Conference Proceedings
Conference Proceedings
4. Comparative evaluation of mask production CAR development processes with stepwise defect inspection
Jeong, W.-G. ; Lee, J.-K. ; Park, D.I. ; Park, E.-S. ; Lee, J.-H. ; Seo, S.-K. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.S. ; Jeong, S.H.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part One  pp.626-633,  2002.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889
5.

Conference Proceedings
Conference Proceedings
5. Design and fabrication of focusing nearfield optical probe for biomolecule trapping application
Choi, S.S. ; Jung, M.Y. ; Song, M.S. ; Park, M.J. ; Kim, D.W.
Pub. info.: Nanomanipulation with Light.  pp.105-110,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5736