1.

Conference Proceedings
Conference Proceedings
1. Comparison of Tungsten Bit Line Mask Scheme for the Next Generation 4Giga DRAM
Hong, J. ; Jeon, J.S. ; Choi, J.D. ; Min, G.J. ; Chi, K.K.
Pub. info.: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology.  pp.507-515,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-17
2.

Technical Paper
Technical Paper
2. A Quantitative Study for Critical Factors of Automotive Battery Durability.
Park, C.H. ; Yoon, J.H. ; Choi, J.D.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007