1.

Conference Proceedings
Conference Proceedings
1. Abnormal Hysteresis Property of SiC Oxide C-V Characteristics
Choi, J.-S. ; Lee, W.-S. ; Shin, D.-H. ; Lee, H.-G. ; Kim, Y.-S. ; Park, K.-H.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1021-1024,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
2.

Conference Proceedings
Conference Proceedings
2. The optimization of the soft bake step for the Low-k application using novel porous ladder-type HSQ
Cho, J.-H. ; Lee, J.-H. ; Choi, J.-S. ; Chon, S.-M.
Pub. info.: Nanoscale devices, materials, and biological systems : fundamentals and applications : proceedings of the international symposium.  pp.269-280,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-13
3.

Conference Proceedings
Conference Proceedings
3. Controlled surface modification of alumina-supported Mo or Co-Mo sulfides by surface organometallic chemistry
Choi, J.-S. ; Clair, C. Petit ; Uzio, D.
Pub. info.: Scientific Bases for the Preparation of Heterogeneous Catalysts : proceedings of the 8th International Symposium, Louvain-la-Neuve, Belgium, September 9-12, 2002.  pp.585-594,  2002.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 143
4.

Conference Proceedings
Conference Proceedings
4. Abnormal Hysteresis Property of SiC Oxide C-V Characteristics
Choi, J.-S. ; Lee, W.-S. ; Shin, D.-H. ; Lee, H.-G. ; Kim, Y.-S. ; Park, K.-H.
Pub. info.: Silicon carbide and related materials 2001 : ICSCRM2001, proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28-November 2, 2001.  pp.1021-1024,  2002.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 389-393
5.

Technical Paper
Technical Paper
5. Development of Durability Analysis Automation System. (DAAS)
Koo, J.K. ; Lee, Y.-G. ; Choi, J.-S. ; Choo, D.-G. ; Shin, S.-Y.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
6.

Technical Paper
Technical Paper
6. Assessing Reductant Chemistry During in-Cylinder Regeneration of Diesel Lean NOx Traps.
West, B. ; Huff, S. ; Parks, J. ; Lewis, S. ; Choi, J.-S.
Pub. info.: 2004 Powertrain and Fluid Systems Conference and Exhibition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
7.

Conference Proceedings
Conference Proceedings
7. A memory efficient large mask data handling method using repetition [6349-43]
Choi, J.-S. ; Shin, J.-P. ; Lee, J.-B. ; Yoo, M.-H. ; Kong, J.-T.
Pub. info.: Photomask Technology 2006.  pp.634918-634918,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6349
8.

Conference Proceedings
Conference Proceedings
8. Aberration sensitivity control for the isolation layer in low-k1 DRAM process
Cho, B.-H. ; Yim, D. ; Park, C.-H. ; Lee, S.-H. ; Yang, H.-J. ; Choi, J.-H. ; Shin, Y.-C. ; Kim, C.-D. ; Choi, J.-S. ; Kang, K.-O. ; Kim, S.-W. ; Yu, T.-H. ; Hong, J. ; Kim, J.-C. ; Han, M.-S. ; Heo, H.-Y. ; Kim, Y.-D. ; Lee, D.-D. ; Yoon, G.-H. ; van schoot, J.B. ; Theeuwes, T. ; Min, Y.-H.
Pub. info.: Optical Microlithography XV.  Part Two  pp.831-839,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4691
9.

Conference Proceedings
Conference Proceedings
9. Belly button reduction using optimized resist filtration method in CMOS gate pattern process
Baik, J.-H. ; Lee, D.-J. ; Lee, S.-H. ; Park, S.-H. ; Lee, I.-H. ; Choi, J.-S.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.753-760,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
10.

Conference Proceedings
Conference Proceedings
10. Flow estimation for motion analysis on compressed domain
Kim, N.-W. ; Kim, T.-Y. ; Choi, J.-S.
Pub. info.: Storage and Retrieval Methods and Applications for Multimedia 2004.  pp.501-509,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5307