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14 results

Conference Proceedings

1. MATERIAL PARAMETERS IN A THICK HYDROGENATED AMORPHOUS SILICON DETECTOR AND THEIR EFFECT ON SIGNAL COLLECTION

Qurishi, S. ; Perez-Mendez, V. ; Kaplan, S. N. ; Fujieda, I. ; Cho, G. ; Street, R. A.

Pub. info.:	Amorphous silicon technology, 1989 : symposium held April 25-28, 1989, San Diego, California, U.S.A.. pp.649-654, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	149

Conference Proceedings

2. *THE APPLICATION OF THICK HYDROGENATED AMORPHOUS SILICON LAYERS TO CHARGED PARTICLE AND X-RAY DETECTION

Perez-Mendez, V. ; Cho, G. ; Fujieda, I. ; Kaplan, S. N. ; Qureshi, S. ; Street, R. A.

Pub. info.:	Amorphous silicon technology, 1989 : symposium held April 25-28, 1989, San Diego, California, U.S.A.. pp.621-630, 1989. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	149

Conference Proceedings

3. CHARGE-SENSITIVE POLY-SILICON TFT AMPLIFIERS FOR a-Si:H PIXEL PARTICLE DETECTORS

Cho, G. ; Perez-Mendez, V. ; Hack, M. ; Lewis, A.

Pub. info.:	Amorphous silicon technology, 1992. pp.1181-1186, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

4. IMPROVEMENT OF THICK a-Si RADIATION DETECTORS BY FIELD PROFILE TAILORING

Drewery, J.S. ; Cho, G. ; Jing, T. ; Kaplan, S.N. ; Mireshghi, A. ; Perez-Mendez, V. ; Wildermuth, D.

Pub. info.:	Amorphous silicon technology, 1992. pp.1063-1068, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

5. DETECTION OF CHARGED PARTICLES IN THICK HYDROGENATED AMORPHOUS SILICON LAYERS

Fujieda, I. ; Cho, G. ; Kaplan, S.N. ; Perez-Mendez, V. ; Qureshi, S. ; Ward, W. ; Street, R.A.

Pub. info.:	Amorphous silicon technology : symposium held April 5-8, 1988, Reno, Nevada, U.S.A.. pp.469-476, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	118

Conference Proceedings

6. NEW a-Si:H PHOTO-DETECTORS FOR LONG-TERM CHARGE STORAGE

Lee, H. ; Cho, G. ; Drewery, J.S. ; Hong, W.S. ; Jing, T. ; Kaplan, S.N. ; Mireshghi, A. ; Perez-Mendez, V. ; Wildermuth, D.

Pub. info.:	Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.1023-1030, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	297

Conference Proceedings

7. UTILIZATION OF a-Si:H SWITCHING DIODES FOR SIGNAL READOUT FROM a-Si:H PIXEL DETECTORS

Cho, G. ; Drewery, J.S. ; Hong, W.S. ; Jing, T. ; Lee, H. ; Kaplan, S.N. ; Mireshghi, A. ; Perez-Mendez, V. ; Wildermuth, D.

Pub. info.:	Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.969-974, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	297

Conference Proceedings

8. Fast-response variable focusing micromirror array lens

IV, J.G.B. ; Cho, G. ; Pachalla, R.S. ; Lagoudas, D.C. ; Girimaji, S.S.

Pub. info.:	Smart structures and materials 2003 : Smart electronics, MEMS, BioMEMS, and nanotechnology : 3-6 March 2003, San Diego, California, USA. pp.278-286, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5055

Conference Proceedings

9. RADIATION DETECTION WITH EVAPORATED CsI(T1) COUPLED TO a-Si:H PHOTODIODE LAYERS

Fujieda, I. ; Cho, G. ; Drewery, J. ; Gee, T. ; Jing, T. ; Kaplan, S.N. ; Perez-Mendez, V. ; Wildermuth, D.

Pub. info.:	Amorphous silicon technology 1991 : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.. pp.191-196, 1991. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	219

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Conference Proceedings

10. Spectroscopic analysis of charge transport characteristics in wide-bandgap semiconductor detectors

Kim, Y.S. ; Cho, G. ; Kim, H.K. ; Kim, K.H. ; Kim, H.J.

Pub. info.:	Medical Imaging 2002 : Physics of Medical Imaging : 24-26 February 2002, San Diego, California, USA. pp.601-611, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4682

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Author: Cho, G.