1.

Conference Proceedings
Conference Proceedings
1. Characterizing polarization controllers with Mueller matrix polarimetry
Drewes,J.J. ; Chipman,R.A. ; Smith,M.H.
Pub. info.: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  pp.462-466,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4532
2.

Conference Proceedings
Conference Proceedings
2. Polarization issues in fiber systems
Chipman,R.A.
Pub. info.: Polarization analysis, measurement, and remote sensing IV : 29-31 July 2001, San Diego, USA.  pp.81-86,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4481
3.

Conference Proceedings
Conference Proceedings
3. Automated MTF analyzer for spectacle lenses
Drewes,J. ; Chipman,R.A. ; Hadaway,J.B. ; Ahmad,A.
Pub. info.: Optical manufacturing and testing II : 27-29 July 1997, San Diego, California.  pp.122-135,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3134
4.

Conference Proceedings
Conference Proceedings
4. High-resolution Mueller matrix polarimetry of thin film PLZT electro-optic modulators
Sornsin,E.A. ; Chipman,R.A.
Pub. info.: Miniaturized systems with micro-optics and micromechanics II : 10-12 February 1997, San Jose, California.  pp.373-378,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3008
5.

Conference Proceedings
Conference Proceedings
5. High-order PMD emulator
Chipman,R.A. ; Kinnera,R.
Pub. info.: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  pp.227-233,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4532
6.

Conference Proceedings
Conference Proceedings
6. Structure of the Mueller calculus
Chipman,R.A.
Pub. info.: Polarization analysis, measurement, and remote sensing III : 2-4 August 2000, San Diego, USA.  pp.1-9,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4133
7.

Conference Proceedings
Conference Proceedings
7. Depolarization
Chipman,R.A.
Pub. info.: Polarization: measurement, analysis, and remote sensing II : 19-21 July 1999, Denver, Colorado.  pp.14-20,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3754
8.

Conference Proceedings
Conference Proceedings
8. Electro-optic spatial light modulator characterization using Mueller matrix imaging
Sornsin,E.A. ; Chipman,R.A.
Pub. info.: Polarization: measurement, analysis, and remote sensing : 30 July-1 August 1997, San Diego, California.  pp.161-166,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3121
9.

Conference Proceedings
Conference Proceedings
9. Alignment and calibration of an infrared achromatic retarder using FTIR Mueller matrix spectropolarimetry
Sornsin,E.A. ; Chipman,R.A.
Pub. info.: Polarization: measurement, analysis, and remote sensing : 30 July-1 August 1997, San Diego, California.  pp.28-34,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3121
10.

Conference Proceedings
Conference Proceedings
10. Decomposition of Mueller matrices
Chipman,R.A. ; Lu,S.-Y.
Pub. info.: Wideband interferometric sensing and imaging polarimetry : 28-29 July 1997, San Diego, California.  pp.385-396,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3120