1.

Conference Proceedings
Conference Proceedings
1. Ultrathin Oxide Reliability: Effects of Gate Doping Concentration and Poly- Si/SiO2 Interface Stress Relaxation
Wristers, D. ; Wang, H.H. ; Han, L.K. ; Lin, C. ; Chen, T.S. ; Kwong, D.L. ; Fulford, J.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.733-743,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1
2.

Technical Paper
Technical Paper
2. MONTE CARLO STUDIES OF TRANSPORT IN A REVERSED FIELD PINCH
Chen, T.S.
Pub. info.: NASA Technical Reports.  (IPPJ-813),  pp.1-38,  1987.  National Aeronautics and Space Administration
3.

Technical Paper
Technical Paper
3. Measurements of Turbulent Mixed Convection Flow Over a Vertical Forward-Facing Step.
Abu-Mulaweh, H.I. ; Armaly, B.F. ; Chen, T.S.
Pub. info.: A.S.M.E. paper.  2003.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : HT
Ser. no.: 2003