1.

Conference Proceedings
Conference Proceedings
1. DEPOSITION OF METAL NANOPARTICLESOF DIAMOND SURFACE VIA A SOLUTION ROUTE
Arunagiri, T. ; Gao, J.-S. ; Chen, J.-J. ; Goodwill, P. ; Chyan, O.
Pub. info.: Electrochemistry of carbon materials : proceedings of the international symposium.  pp.26-37,  2000.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-34
2.

Conference Proceedings
Conference Proceedings
2. Spartan Infrared Camera: high-resolution imaging for the SOAR Telescope
Loh, E. D. ; Biel, J. D. ; Chen, J.-J. ; Davis, M. ; Laporte, R. ; Loh, O. Y.
Pub. info.: Ground-based instrumentation for astronomy : 21-25 June 2004, Glasgow, Scotland, United Kingdom.  pp.1644-1652,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5492
3.

Conference Proceedings
Conference Proceedings
3. Amplification of the index of refraction of aqueous immersion fluids by ionic surfactants
Fu, S.-C. ; Chen, J.-J. ; Shiu, F.-J. ; Kuo, C.-S. ; Shiau, G.-Y. ; Tsia, C.-S. ; Wang, C.
Pub. info.: Advances in resist technology and processing XXII : 28 February-2 March, 2005, San Jose, California, USA.  pp.537-553,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5753(1)
4.

Technical Paper
Technical Paper
4. Prediction of resonant response of blades having 3D nonlinear shroud constraint using multi-harmonic balance method
Chen, J.-J. ; Menq, C.-H.
Pub. info.: AIAA paper.  pp.1-10,  1998.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit
Ser. no.: 1998
5.

Conference Proceedings
Conference Proceedings
5. Maximization of process window for low-k1 spacing using KrF lithography
Fu, S.-C. ; Kuo, C.-S. ; Shiu, F.-J. ; Chen, J.-J. ; Tsia, C.-S. ; Ho, C.-T. ; Wang, C.
Pub. info.: Optical Microlithography XVI.  Part Two  pp.955-966,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5040
6.

Conference Proceedings
Conference Proceedings
6. Photomask defect tracing, analysis, and reduction with chemically amplified resist process
Lin, C.-. ; Lai, R. ; Huang, W.H. ; Wang, B.C. ; Chen, C.Y. ; Kung, C.H. ; Yoo, C.-S. ; Chen, J.-J. ; Lee, S.-C.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.205-212,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130