1.

Conference Proceedings
Conference Proceedings
1. Optical PCB inspection system based on Hausdorff distance
Chen, C. -J. ; Lai, S. -H. ; Liu, S. -W. ; Ku, T. ; Yeh, S. Y. -C.
Pub. info.: Machine Vision Applications in Industrial Inspection XIII.  pp.53-61,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5679
2.

Conference Proceedings
Conference Proceedings
2. E-beam lithography experimental results and simulation for the 45-nm node
Nistler, J. ; Chen, C. -J. ; Vychub, S. ; Lee, H. -C. ; Yeh, L. -C. ; Hsieh, H. -C. ; Sambale, C. ; Hofmann, U.
Pub. info.: 24th Annual BACUS Symposium on Photomask Technology.  pp.565-574,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5567