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13 results

Conference Proceedings

1. AXAF high-resolution camera (HRC): the challenge of calibration

Murray,S.S. ; Chappell,J.H. ; Kenter,A.T. ; Kraft,R.P. ; Meehan,G.R. ; Zombeck,M.V.

Pub. info.:	Space telescopes and instruments V : 25-28 March 1998, Kona, Hawaii. Part 2 pp.974-984, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3356

Conference Proceedings

2. In-flight performance and calibration of the Chandra high-resolution camera imager(HRC-I)

Kenter,A.T. ; Chappell,J.H. ; Kraft,R.P. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Hole,K.T. ; Juda,M. ; Donnelly,R.H. ; Patnaude,D. ; Pease,D.O. ; Wilton,C. ; Zhao,P. ; Austin,G.K. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N. ; Barbera,M. ; Collura,A.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.467-492, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

3. In-flight performance and calibration of the Chandra high-resolution camera spectroscopic readout(HRC-S)

Kraft,R.P. ; Chappell,J.H. ; Kenter,A.T. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Donnelly,R.H. ; Drake,J.J. ; Johnson,C.O. ; Juda,M. ; Patnaude,D. ; Pease,D.O. ; Ratzlaff,P.W. ; Wargelin,B.J. ; Austin,G.K. ; Fraser,G.W. ; Pearson,J.F. ; Lees,J.E. ; Brunton,A.N.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.493-517, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

4. In-flight performance of the Chandra high-resolution camera

Murray,S.S. ; Austin,G.K. ; Chappell,J.H. ; Gomes,J.J. ; Kenter,A.T. ; Kraft,R.P. ; Meehan,G.R. ; Zombeck,M.V. ; Fraser,G.W. ; Serio,S.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.68-80, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

5. Improving Chandra High-Resolution Camera event posltions via corrections to crossed-grid charge detector signals

Juda,M. ; Austin,G.K. ; Chappell,J.H. ; Gomes,J.J. ; Kenter,A.T. ; Kraft,R.P. ; Murray,S.S. ; Zombeck,M.V.

Pub. info.:	X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.155-165, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4140

Conference Proceedings

6. Event screening for the Chandra X-Ray Observatory High-Resolution Camera (HRC)

Murray,S.S. ; Chappell,J.H. ; Kenter,A.T. ; Juda,M. ; Kraft,R.P. ; Zombeck,M.V. ; Meehan,G.R. ; Austin,G.K. ; Gomes,J.J.

Pub. info.:	X-ray, and gamma-ray instrumentation for astronomy XI : 2-4 August 2000 San Diego, USA. pp.144-154, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4140

Conference Proceedings

7. High-Resolution Camera on AXAF

Kenter,A.T. ; Chappell,J.H. ; Kraft,R.P. ; Meehan,G.R. ; Murray,S.S. ; Zombeck,M.V. ; Fraser,G.W.

Pub. info.:	EUV, X-ray, and gamma-ray instrumentation for astronomy VII : 7-9 August 1996, Denver, Colorado. pp.626-649, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2808

Conference Proceedings

8. Performance and calibration of the AXAF High-Resolution Camera I: imaging readout

Kenter,A.T. ; Chappell,J.H. ; Kobayashi,K. ; Kraft,R. P. ; Meehan,G. R. ; Murray,S. S. ; Zombeck,M. V. ; Fraser,G. W. ; Pearson,J. F. ; Lees,J. E. ; Brunton,A. N. ; Pearce,S. E. ; Barbera,M. ; Collura,A. ; Serio,S.

Pub. info.:	EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. pp.26-52, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3114

Conference Proceedings

9. AXAF High-Resolution Camera (HRC): calibration and recalibration at XRCF and beyond

Murray,S.S. ; Chappell,J.H. ; Kenter,A. T. ; Kobayashi,K. ; Kraft,R. P. ; Meehan,G. R. ; Zombeck,M. V. ; Fraser,G. W. ; Pearcon,J. F. ; Lees,J. E. ; Brunton,A. N. ; Pearce,S. E. ; Barbera,M. ; Collura,A. ; Serio,S.

Pub. info.:	EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. pp.11-25, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3114

10.

Conference Proceedings

10. Performance and calibration of the AXAF High-Resolution Camera II: the spectroscopic detector

Kraft,R.P. ; Chappell,J.H. ; Kenter,A. T. ; Kobayashi,K. ; Meehan,G. R. ; Murray,S. S. ; Zombeck,M. V. ; Fraser,G. W. ; Pearson,J. F. ; Lees,J. E. ; Brunton,A. N. ; Barbera,M. ; Collura,A. ; Serio,S.

Pub. info.:	EUV, X-ray, and gamma-ray instrumentation for astronomy VIII : 30 July - 1 August 1997, San Diego, California, Oswald H. W. Siegmund, Mark A. Gummin, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering. pp.53-73, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3114

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Author: Chappell,J.H.