1.

Conference Proceedings

Conference Proceedings
Chang,Y. ; Peng,F. ; Zhu,G. ; Zhu,Y. ; Zhou,X.
Pub. info.: Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China.  pp.16-19,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4554
2.

Conference Proceedings

Conference Proceedings
Wang,P. ; Chang,Y. ; Xu,Y. ; Ye,C.
Pub. info.: Electro-optic and second harmonic generation materials, devices, and applications II : 18-19 September, 1998, Beijing, China.  pp.73-83,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3556
3.

Conference Proceedings

Conference Proceedings
Chang,Y. ; Maciejko,R. ; Leonelli,R. ; Thorpe,A.Spring
Pub. info.: Applications of photonic technology 3 : closing the gap between theory, development, and application.  pp.1155-1157,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3491
4.

Conference Proceedings

Conference Proceedings
Cheng,Y. ; Chang,Y. ; Lin,C. ; Hsu,L. ; Chyu,M.K.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.181-191,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
5.

Conference Proceedings

Conference Proceedings
Chang,Y. ; Chu,J. ; Ji,R.B. ; Wang,X. ; Huang,G. ; Li,J.F. ; He,L. ; Tang,D.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.182-185,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
6.

Conference Proceedings

Conference Proceedings
Min,W. ; Chang,Y. ; Schubert,S.D.
Pub. info.: Wavelet applications IV : 22-24 April 1997, Orlando, Florida.  pp.139-146,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3078
7.

Conference Proceedings

Conference Proceedings
Chu,J. ; Liu,K. ; Chang,Y. ; Liu,P. ; Li,B. ; Guo,S. ; Chen,M. ; Tang,D.
Pub. info.: Material science and material properties for infrared optoelectronics : 30 September-2 October 1996, Uzhgorod, Ukraine.  pp.30-38,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3182
8.

Conference Proceedings

Conference Proceedings
Liu,X.T. ; Liu,Z.H. ; Chang,Y. ; Chu,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.532-534,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
9.

Conference Proceedings

Conference Proceedings
Wang,X. ; Chang,Y. ; Cao,X. ; Gui,Y. ; Chu,J.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.298-301,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings

Conference Proceedings
Ruan,H. ; Gan,F. ; Chang,Y.
Pub. info.: Rare-earth-doped materials and devices III : 27-28 January 1999, San Jose, California.  pp.66-73,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3622