1.

Conference Proceedings
Conference Proceedings
1. Breakdown Characteristics of Ultrathin Gate Oxides Caused by Plasma Charging
Chen, C-C. ; Lin, H-C. ; Chang, C-Y. ; Chien, C-H. ; Huang, T-Y.
Pub. info.: Ultrathin SiO[2] and high-K materials for USLI gate dielectrics : symposium held April 5-8, 1999, in San Francisco, California, U.S.A..  pp.313-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 567
2.

Technical Paper
Technical Paper
2. Analysis and Verifications for Meso- Scale Heat Exchanger with Magneto- Hydrodynamic (MHD) Pumps.
Wang, P-J. ; Chang, C-Y.
Pub. info.: A.S.M.E. paper.  2003.  New York, NY.  American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : IMECE
Ser. no.: 2003