Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.63523M-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Cha, C. ; Kim, J.H. ; Huang, Z. ; Jokerst, N.M. ; Brooke, M.A.
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Semiconductor photodetectors : 28-29 January 2004, San Jose, California, USA. pp.89-96, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
In search of excellence : conference proceedings : ANTEC '91, Montreal. pp.1578-1580, 1991. Brookfield Center, CT. Society of Plastics Engineers, Inc. (SPE)
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Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Huang, Z. ; Cha, C. ; Chen, S. ; Sarmiento, T. ; Shen, Jeng Jung ; Jokerst, N.M. ; Brooke, M.A. ; May, G. ; Brown, A.S.
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Optical modeling and performancen predictions : 6-7 August 2003, San Diego, California, USA. pp.148-155, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Choi, J. ; Lee, S. ; Cho, Y. ; Ji, S. ; Cha, C. ; Choi, W. S. ; Han, S. W.
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Photomask and Next-Generation Lithography Mask Technology XIII. pp.62830A-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering