1.

Conference Proceedings

Conference Proceedings
Eland,K.L. ; Stratis,D.N. ; Carter,J.C. ; Angel,S.M.
Pub. info.: Environmental monitoring and remediation technologies II : 20-22 September, 1999, Boston, Massachusetts.  pp.288-294,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3853
2.

Conference Proceedings

Conference Proceedings
Carter,J.C. ; Stratis,D.N. ; Sharma,S.K. ; Angel,S.M.
Pub. info.: Internal standardization and calibration architectures for chemical sensors : 20-22 September 1999, Boston, Massachusetts.  pp.57-69,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3856
3.

Conference Proceedings

Conference Proceedings
Glenn,S.J. ; Cullum,B.M. ; Carter,J.C. ; Nair,R.B. ; Nivens,D.A. ; Murphy,C.J. ; Angel,S.M.
Pub. info.: Chemical, biochemical, and environmental fiber sensors X : 2-3 November 1998, Boston, Massachusetts.  pp.235-245,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3540
4.

Conference Proceedings

Conference Proceedings
Carter,J.C. ; Egan,W.J. ; Nair,R.B. ; Murphy,C.J. ; Morgan,S.L. ; Angel,S.M.
Pub. info.: Chemical, biochemical, and environmental fiber sensors X : 2-3 November 1998, Boston, Massachusetts.  pp.210-221,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3540
5.

Conference Proceedings

Conference Proceedings
Carter,J.C. ; Stratis,D.N. ; Sharma,S.K. ; Scrivens,W.A. ; Angel,S.M.
Pub. info.: Pattern recognition, chemometrics, and imaging for optical environmental monitoring : 20-21 September 1999, Boston, Massahcusetts.  pp.9-19,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3854
6.

Conference Proceedings

Conference Proceedings
Parton,D.P. ; Markvart,T. ; Ashburn,P. ; Carter,J.C. ; Ciastafier,L.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1903-1908,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201