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12 results

Conference Proceedings

1. HIGH RESOLUTION ANALYSIS OF STRUCTURE AND CHEMISTRY OF GRAIN BOUNDARIES IN SILICON

Kim, M. J. ; Carpenter, R. W.

Pub. info.:	Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.157-162, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	238

Conference Proceedings

2. GOLD-SILICON INTERFACES: HIGH RESOLUTION ELECTRON MICROSCOPY REACTIONS, PRECIPITATION AND SUBSURFACE GETTERING

Carpenter, R. W. ; Kim, M. J.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.153-160, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

3. ANALYSIS OF OXYGEN DISTRIBUTION IN INTERFACES IN SiC WHISKER REINFORCED Si3N4-BASED COMPOSITES

Chowdhury, K. Das ; Carpenter, R. W. ; Braue, W.

Pub. info.:	Structure and properties of interfaces in materials : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.421-426, 1992. Pittsburgh. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	238

Conference Proceedings

4. TIME-RESOLVED STUDIES OF RAPID SOLIDIFICATION IN HIGHLY UNDERCOOLED MOLTEN SILICON

Lowndes, D. H. ; Jellison Jr., G. E. ; Wood, R. F. ; Peenycook, S. J. ; Carpenter, R. W.

Pub. info.:	Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.. pp.101-106, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	35

Conference Proceedings

5. DEEP LEVELS ASSOCIATED WITH OXYGEN PRECIPITATION IN CZ SILICON AND CORRELATION WITH MINORITY CARRIER LIFETIMES

Chan, S.S. ; Varker, C. J. ; Whitfield, J. ; Carpenter, R. W.

Pub. info.:	Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.. pp.281-286, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	46

Conference Proceedings

6. STRUCTURAL AND CHEMICAL MICROANALYSIS OF OXYGEN-BEARING PRECIPITATES IN SILICON

Carpenter, R. W. ; Chan, I ; Tsi, H. I ; Varker, C. ; Demer, L. J.

Pub. info.:	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.195-200, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	14

Conference Proceedings

7. CHEMICAL WIDTHS AT COMPOSITE INTERFACES: RELATIONSHIPS TO STRUCTURAL WIDTHS AND METHODS FOR MEASUREMENT

Carpenter, R. W. ; Bow, J. S. ; Kim, M. J. ; Chowdhury, K. Das ; Braue, W.

Pub. info.:	Structure and properties of interfaces in ceramics : symposium held November 28-December 2, 1994, Boston, Massachusetts, U.S.A.. pp.271-, 1995. Pittsburgh, PA.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	357

Conference Proceedings

8. Si/SiC UHV direct wafer bonded interface structure

Kim, M. J. ; Xu, Hong ; Liu, R.-J. ; Cox, M. J. ; Carpenter, R. W.

Pub. info.:	Substrate engineering - paving the way to epitaxy : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.O4.2.1-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	587

Conference Proceedings

9. ELECTRICAL CHARACTERIZATION OF HIGHLY STRAINED ULTRATHIN InAs/GaAs QUANTUM WELLS

Yu, F. ; Droopad, R. ; Maracas, G. N. ; Liu, J. ; Rajesh, R. ; Carpenter, R. W.

Pub. info.:	Growth, processing, and characterization of semiconductor heterostructures : Symposium held November 29-December 2, 1993, Massachusetts, U.S.A.. pp.151-, 1994. Pittsburgh. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	326

10.

Conference Proceedings

10. AN HREM STUDY OF THE MICROSTRUCTURE OF Al CONTACT ON GaN/AlN/SiC THIN FILMS

Huang, Y. ; Smith, L. ; Kim. M. J. ; Carpenter, R. W. ; Davis, R. F.

Pub. info.:	Evolution of thin film and surface structure and morphology : symposium held November 28-December 2, 1994, Boston, Massachusetts, USA. pp.433-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	355

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