Surface scattering and diffraction III : 4-6 August 2003, San Diego, California, USA. pp.145-152, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Earth observing systems VIII : 3-6 August 2003, San Diego, California, USA. pp.454-462, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Butler, J.J. ; Park, H. ; Bgrnes, P.Y. ; Early, E.A. ; van Eijk-Olij, C. ; Zoutman, A.E. ; van Buller-Leeuwen, S. ; Schaarsberg, J.G.
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Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece. pp.345-354, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Marketon, J. ; Abel, P. ; Butler, J.J. ; Smith, G.R. ; Cooper, J.W.
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Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece. pp.378-385, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA. pp.165-175, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering