1.

Conference Proceedings

Conference Proceedings
Georgiev, G. ; Butler, J.J.
Pub. info.: Surface scattering and diffraction III : 4-6 August 2003, San Diego, California, USA.  pp.145-152,  2003.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5189
2.

Conference Proceedings

Conference Proceedings
Johnson, B.C. ; Litorja, M. ; Butler, J.J.
Pub. info.: Earth observing systems VIII : 3-6 August 2003, San Diego, California, USA.  pp.454-462,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5151
3.

Conference Proceedings

Conference Proceedings
Butler, J.J. ; Park, H. ; Bgrnes, P.Y. ; Early, E.A. ; van Eijk-Olij, C. ; Zoutman, A.E. ; van Buller-Leeuwen, S. ; Schaarsberg, J.G.
Pub. info.: Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece.  pp.345-354,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4881
4.

Conference Proceedings

Conference Proceedings
Marketon, J. ; Abel, P. ; Butler, J.J. ; Smith, G.R. ; Cooper, J.W.
Pub. info.: Sensors, systems, and next-generation satellites VI : 23-26 September 2002, Agia Pelagia, Crete, Greece.  pp.378-385,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4881
5.

Conference Proceedings

Conference Proceedings
Georgiev, G.T. ; Butler, J.J.
Pub. info.: Surface scattering and diffraction for advanced metrology II : 9 July 2002 Seattle, Washington, USA.  pp.165-175,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4780