1.

Conference Proceedings

Conference Proceedings
Bezombes, F.A. ; Allanson, D.R. ; Burton, D.R. ; Lalor, M.J.
Pub. info.: Microsystems Engineering: Metrology and Inspection III.  pp.117-127,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5145
2.

Conference Proceedings

Conference Proceedings
Skydan, O.A. ; Lalor, M.J. ; Burton, D.R.
Pub. info.: Interferometry XI: Techniques and Analysis.  pp.39-48,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4777
3.

Conference Proceedings

Conference Proceedings
Gdeisat, M.A. ; Burton, D.R. ; Lalor, M.J.
Pub. info.: Interferometry XI: Techniques and Analysis.  pp.259-270,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4777