1.
|
Conference Proceedings
|
Bezombes, F.A. ; Allanson, D.R. ; Burton, D.R. ; Lalor, M.J.
Pub. info.: |
Microsystems Engineering: Metrology and Inspection III. pp.117-127, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
5145 |
|
2.
|
Conference Proceedings
|
Skydan, O.A. ; Lalor, M.J. ; Burton, D.R.
Pub. info.: |
Interferometry XI: Techniques and Analysis. pp.39-48, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
4777 |
|
3.
|
Conference Proceedings
|
Gdeisat, M.A. ; Burton, D.R. ; Lalor, M.J.
Pub. info.: |
Interferometry XI: Techniques and Analysis. pp.259-270, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering |
Title of ser.: |
Proceedings of SPIE - the International Society for Optical Engineering |
Ser. no.: |
4777 |
|