1.

Conference Proceedings
Conference Proceedings
1. Hot Carrier Degradation of Gain in Bipolar Transistors
Kizilyalli, Isik C. ; Bude, Jeff D.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.11-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
2.

Conference Proceedings
Conference Proceedings
2. A Novel, Nanocrystal (nc) Based Non-Volatile Memory Device
Blauwe, Jan W. De ; Green, Marty L. ; Sorsch, Tom W. ; Weber, Garry R. ; Bude, Jeff D. ; Kerber, Andi ; Klemens, Fred ; Kim, Young ; Ostraat, Michele L. ; Flagan, Richard C. ; Atwater, Harry A.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638