1.

Conference Proceedings
Conference Proceedings
1. STRUCTURAL CHARACTERIZATION OF Pt/Co MULTILAYERS FOR MAGNETOOPTIC RECORDING USING X-RAY DIFFRACTION
Bain, James E. ; Clemens, Bruce M. ; Brennan, Sean
Pub. info.: Magnetic ultrathin films : multilayers and surfaces, interfaces and characterization : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.799-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 313
2.

Conference Proceedings
Conference Proceedings
2. IN-SITU OBSERVATION OF THE INITIAL STAGES OF Co (0001) EPITAXY ON Pt (111) USING GRAZING INCIDENCE X-RAY DIFFRACTION
Bain, James A. ; Clemens, Bruce M. ; Brennan, Sean
Pub. info.: Common themes and mechanisms of epitaxial growth : symposium held April 13-15, 1993, San Francisco, California, U.S.A..  pp.291-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 312
3.

Conference Proceedings
Conference Proceedings
3. SYNCHROTRON RADIATION FOR MEASUREMENT OF CONTAMINANTS ON SILICON SURFACES
Madden, Michael C. ; Wherry, David C. ; Pianetta, Piero ; Brennan, Sean
Pub. info.: Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.125-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 307
4.

Conference Proceedings
Conference Proceedings
4. X-RAY OBSERVATION OF STRESS GRADIENTS AND PRECIPITATION IN PASSIVATED A1-0.5%Cu FILMS
Besser, Paul R. ; Brennan, Sean ; Bravman, John C.
Pub. info.: Applications of synchrotron radiation techniques to materials science : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.161-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 307
5.

Conference Proceedings
Conference Proceedings
5. X-ray Absorption Spectroscopy on Copper Trace Impurities on Silicon Wafers
Singh, Andy ; Baur, Katharina ; Brennan, Sean ; Homma, Takayuki ; Kubo, Nobuhiko ; Pianetta, Piero
Pub. info.: Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.23-28,  2002.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 716
6.

Conference Proceedings
Conference Proceedings
6. CALCULATION OF STRESS GRADIENTS IN THIN Al-0.5% Cu/Ti LINES FROM STRAIN GRADIENTS MEASURED AS A FUNCTION OF TEMPERATURE USING GRAZING INCIDENCE X-RAY SCATTERING
Besser, Paul R. ; Venkatraman, Ramnath ; Brennan, Sean ; Bravman, John C.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.233-238,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
7.

Conference Proceedings
Conference Proceedings
7. DETERMINATION OF STRAIN DISTRIBUTIONS IN ALUMINUM THIN FILMS AS A FUNCTION OF TEMPERATURE BY THE USE OF SYNCHROTRON GRAZING INCIDENCE X-RAY SCATTERING
Venkatraman, Ramnath ; Besser, Paul R. ; Brennan, Sean ; Bravman, John C.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.227-232,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239