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23 results

Conference Proceedings

1. BARRIER HEIGHT REDUCTION AT THE Pd-Ge/n-GaAs INTERFACE

Meissner, P. L. ; Bravman, J. C. ; Kendelewicz, T. ; Spindt, C. J. ; Herrera-Gomez, A. ; Spicer, W. E. ; Arko, A. J.

Pub. info.:	Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A.. pp.485-492, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	240

Conference Proceedings

2. MORPHOLOGY AND DEFECT STRUCTURE OF SPUTTERED HIGH-QUALITY IN-SITU YBa2Cu3Oδ FILMS

Streffer, S. K. ; Lairson, B. M. ; Eom, C. B. ; Marshall, A. F. ; Bravman, J. C. ; Geballe, T. H.

Pub. info.:	High resolution electron microscopy of defects in materials : symposium held April 16-18, 1990, San Francisco, California, USA. pp.363-368, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	183

Conference Proceedings

3. OXIDATION KINETICS OF YBa2Cu3O7-x THIN FILMS IN THE PRESENCE OF ATOMIC OXYGEN AND MOLECULAR OXYGEN BY IN-SITU RESISTIVITY MEASUREMENT

Yamamoto, K. ; Lairson, B. M. ; Bravman, J. C. ; Geballe, T. H.

Pub. info.:	Phase transformation kinetics in thin films : symposium held April 29-May 1, 1991, Anaheim, California, U.S.A.. pp.333-338, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	230

Conference Proceedings

4. Transmission electron microscopy studies of the polycrystalline silison-SiO2 interface

Bravman, J. C. ; Sinclair, R.

Pub. info.:	Interfaces and contacts : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.153-162, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	18

Conference Proceedings

5. INVESTIGATION OF THIN Pd-Ge LAYER FORMATION USING SYNCHROTRON VACUUM ULTRAVIOLET PHOTOEMISSION SPECTROSCOPY

Meissner, P. L. ; Bravman, J. C. ; Kendelewicz, T. ; Miyano, K. ; Spicer, W. E. ; Woicik, J. C. ; Bouldin, C.

Pub. info.:	Advanced metallizations in microelectronics : symposium held April 16-20, 1990, San Francisco, California, U.S.A.. pp.265-272, 1990. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	181

Conference Proceedings

6. MATERIALS AND STRUCTURES FOR HIGH DENSITY I/O INTERCONNECTION SYSTEMS

Hong, S. ; Bravman, J. C. ; Weihs, T. P. ; Kwon, O. K.

Pub. info.:	Electronic packaging materials science III : symposium held November 30-December 4, 1987, Boston, Massachusetts, U.S.A.. pp.309-318, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	108

Conference Proceedings

7. *MICROSTRUCTURES OF POLYSILICON

Sinclair, R. ; Carim, A. H. ; Morgiel, J. ; Bravman, J. C.

Pub. info.:	Polysilicon films and interfaces : symposium held December 1-3, 1987, Boston, Massachusetts, U.S.A.. pp.27-38, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	106

Conference Proceedings

8. Finite Element Modeling of Grain Aspect Ratio and Strain Energy Density in a Textured Copper Thin Film

Vinci, R. P. ; Bravman, J. C.

Pub. info.:	Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.481-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	428

Conference Proceedings

9. Observations of Low-Cycle Fatigue of Al Thin Films For MEMS Applications

Cornella, G. ; Vinci, R. P. ; Iyer, R. Suryanarayanan ; Dauskardt, R. H. ; Bravman, J. C.

Pub. info.:	Microelectromechanical structures for materials research : symposium held April 15-16, 1998 , San Francisco, California, U.S.A.. pp.81-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	518

10.

Conference Proceedings

10. Comparison of Stresses in Al Lines Under Various Passivations

Lee, S. ; Bravman, J. C. ; Flinn, P. A. ; Marieb, T. N.

Pub. info.:	Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.. pp.415-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	473

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